Multiple Wavelength Digital Refractometer ATR-L
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Multiple Wavelength Digital Refractometer ATR-L
Measurement of the critical angle of total reflection at 7 discrete wavelengths, wavelengths range according to prior agreement
Technical data
Measuring range: 1.33200 to 1.70000 nD at 589 nm*
Resolution: 0.00001 nD
Precision: ± 0.0001 at 20°C
Temperature control: Internal electronic Peltier thermostat
Temperature range: +18°C to +30°C (other ranges on request)
Temperature resolution: 0.01°C
Temperature accuracy: 0.03°C
Ambient temperature: +10°C to +40°C
Light source: LED, 7 discrete wavelengths in the range of 500 - 900 nm (others upon request)
Filter bandwidth: ± 10 – 15 nm
Sensor: High resolution CCD-Array with 2048 elements
Prism: Sapphire, scratch-resistant
Sample room: Stainless steel, black Delrin, Teflon, FFKM
Display: Illuminated LCD, 16 x 16 characters, alphanumeric
Data output: RS232 C serial / parallel interface, USB optional
Power supply: 90 – 240 V, 48 – 62 Hz
Dimensions: Measuring head: 250 x 210 x 210 mm
Electronic unit: 225 x 360 x 110 mm
Weight: 8 kg (complete unit)
* the measuring range depends on the selected wavelength
** the DSR- is only calibrated for all built in wavelengths in the temperature range from +10°C up to +40°C. At temperatures above +40°C the accuracy might be narrowly differ from the expected theoretically values due to non-existence of standards at this temperature ranges. precision approx. 0.001 nD.
Customs tariff item : 9027 5000 EU
Country of origin : Federal Republic of Germany
| (-) Technical data: | |
|---|---|
| Product type description: | Refraktometer ATR-L |
| Scale units: | Refractive index |
- Article-No: 03751
- Category: Refractometers
Show all Refractometers from Schmidt&Haensch - Validity: 28.02.2026
- Last Update: 30.01.2026